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HIOKI IM3570 ENG 100%
Frequency sweep measurement can be used to measure the resonance frequency and its impedance, and then the peak comparator function can be used to make a pass/fail judgment on the resonance state.
The Official Ryan Price 2016 Election Guide The Official Ryan Price 2016 Election Guide LOCAL CANDIDATES 52nd Congressional District – Denise Gitsham County Board of Supervisors – Kristin Gaspar City Attorney – Robert Hickey State Assembly 77th District – Brian Maienschein LOCAL BALLOT MEASURES Measure A – San Diego Sales Tax Hike Measure B – Lilac Hills Development Project Measure C – Downtown Stadium / Tax Increase Measure D – Tax Increase and Facilities Measure E – Qualifications for Removal of City Officials Measure F – Tenure for Deputy City Attorneys Measure G – Citizens Review Board on Police Conduct Measure H – SD City Purchasing and Contracting Change Measure I – SD High School Remaining in Balboa Park Measure J – Lease Revenue from Mission Bay Park Measure K – Election Runoff for Top Two Finishers Measure L – City Council Manipulation of Ballot Initiatives Measure M – Affordable Housing – Increase on Projects Measure N – Marijuana Tax Increase NO NO NO NO YES NO YES YES YES YES NO NO YES NO STATE BALLOT MEASURES Prop 51 – School Bonds, Funding for K-12 + Comm.
HIOKI IR4053 ENG 98%
HIOKI IR4053 ENG For Photovoltaic Generation Systems INSULATION TESTER IR4053 Field Measuring Instruments Perform PV insulation resistance measurements Safely, Accurately, Quickly Safely and accurately measure PV insulation resistance even during the daytime Built-in PV dedicated function, displays measurements in 4 seconds Five ranges (50/125/250/500/1000V) built in for normal insulation resistance measurement Built-in 1000 VDC voltage measurement for open voltage tests of PV systems that support 1000 V 2 Use the PV dedicated function for accurate, safe measurements in 4 seconds Measurement not affected by generating PV The IR4053, which was designed for PV, can accurately measure insulation resistance without being affected by the generating PV.
HIOKI BT4560 ENG 98%
Difference in speed Comparison of time taken to measure battery cell internal resistance DC-IR measurement (conventional method) Requires 20 to 30 minutes to around one hour, including charging/discharging AC-IR measurement (using BT4560) Takes just 10 seconds* * When measuring at a frequency of 1 Hz
HIOKI RM3542 ENG 97%
HIOKI RM3542 ENG RESISTANCE HiTESTER RM3542 Component Measuring Instruments Measure in as little as 0.9 ms* High-Speed Resistance Meters Optimized for Automated Systems The RM3542 and RM3542- 01 Resistance HiTESTERs employ the four-terminal DC method to quickly and accurately measure the resistance of components such as resistors and ferrite bead inductors.
HIOKI TM6101 ENG 97%
The TM6101 also offers simpler operation than a spectrometer and can be used to measure color rendering properties.
1 2 3 From Core Indicators of Effectiveness for Community Colleges 4 5 The student success IEMs detail the academic achievement of Harper College students. The institutional success IEMs detail the College’s progress in non‐academic areas. The handout includes additional information about each of the IEMs as well as the Indicators included within each Measure. Institutional Effectiveness Measures can also be viewed on the Institutional Effectiveness Dashboard: http://goforward.harpercollege.edu/about/leadership/accountability/iem/index.php 6 Measure 1: Developmental Education Success Developmental education success measures the academic success of students in the developmental education courses: math and English. Measure 2: Success in Gateway Courses Success in gateway courses measures the academic success of students in college‐level courses. Measure 3: Advancement Rate Advancement rate measures the academic achievements of students (Completion Rate, Transfer Rate, Still Enrolled) Measure 4: Student Persistence Student persistence measures the percent of students who re‐enroll at Harper College from semester to semester.
HIOKI FT3424 ENG 96%
HIOKI FT3424 ENG LUX METER FT3424 Environmental measuring instruments Broad coverage from low to high illuminance Measure at 0.01 lx resolution to a maximum of 200,000 lx Compatible with LED lighting • Complies with DIN Class B and JIS Class AA • Save up to 99 measured values in the instrument’s internal memory and transfer them to a computer later for improved work efficiency • Timer hold function lets you make measurements in remote locations while avoiding the effects of shadows and reflections 2 Support for measurement of 1 lx makes the FT3424 ideal for low-illuminance measurement 20 lx range measurement resolution 0.01 lx 1.
HIOKI IM3590 ENG 96%
2 Measure Electrochemical Components and Materials, Batteries, and EDLCs* *Electric double-layer capacitors Cole-Cole plot In measurement of electrochemical components and materials, Cole-Cole plots are used to ascertain electrode, electrolyte ion, and other characteristics.
HIOKI PW3365 ENG 96%
HIOKI PW3365 ENG CLAMP ON POWER LOGGER PW3365 Power Measuring Instruments Eliminate the risk of short-circuits and electrical accidents The world’s first instrument to offer no-metal-contact power measurement Free from the risk of short-circuit accidents since no metal comes into contact with energized parts, the Clamp On Power Logger PW3365-20 can measure voltage, current, and power right on the cable, letting you safely test in locations that were dangerous or even impossible in the past.
Measurement of the thin films on the bottom of a deep well i.e. the well with high aspect ratio, presents a challenge. Small spot measurement requires high‐NA objective. However, high‐NA objective also limits the depth of the well that can be measured. In this example, our MProbe ™ Vis MSP* system was used to measure oxide (SiO2) layer on the bottom of the round wells. The wells diameters were 80µm, 40µm, 20µm and 10µm ‐ all 100µm deep. The top surface of the sample (Si) had photoresist layer left after lithography. Round wells geometry were selected because it is most difficult to measure as compared to square wells or vias of the same geometry. 20x APO objectives with long working distance (35mm) was use for this measurement. The measurement spot size was ~ 20um. The reason for using this objective was because it has the lowest NA (0.29), which is critical for measurement in the deep wells. Measurements in 80μm and 40μm wells gave a clean signal and were easy to align and focus. In measurements of 20μm and 10μm wells, a part of the light beam was reflected from the top PR, so both oxide thickness and PR thickness signal were present in the measurement, as expected. However, it was still easy to distinguish and determine oxide thickness because of the significantly the thicknesses of oxide and PR were significantly different. The thickness of oxide was ~ 1.6 µm, the thickness of PR ~ 3 µm * MProbe is a registered trademark of Semiconsoft,Inc, Inc. MProbe™ Vis MSP brochure can be found at: http://www.semiconsoft.com/html/download/brochure/MProbeMicro_brochure2012.pdf 83 Pine Hill Rd.
HIOKI 3561 ENG 96%
• Measure high-voltage battery packs up to 300V (with the BT3563) • Ideal for high-precision cell voltage measurements (accurate to 0.01% of reading) • Measurement circuitry employs enhanced current regulation • Fast 10 ms response and 8 ms sampling time for high-speed measurements (with the BT3563 and BT3562) • Ranges from 3 mΩ to 3000 Ω (with the BT3563 and BT3562) support coin-size to large-cell batteries 2 Resistance and voltage measurements BATTERY HiTESTER BT3563 BT3562 3561 Measurement Parameters and Applications l High-voltage battery pack testing l Battery module testing l Large (low-resistance) cell testing l High-speed mass production testing of coin batteries l Fuel cell stack measurements l Battery research and development measurement applications Lithium-Ion and Secondary Batteries Cell phones E-books BATTERY HiTESTER BT3563 BATTERY HiTESTER BT3562 BT3563
HIOKI 3157 ENG 96%
HIOKI 3157 ENG AC GROUNDING HiTESTER 3157-01 Power Measuring Instruments CE certified low-resistance measurement compliant with major safety standards Protective ground tester indispensable for standard certification The 3157-01 AC GROUNDING HiTESTER is designed to measure whether the metal enclosure of an electrical equipment is connected to the ground terminal at sufficiently low resistance levels.
Measurement Summary MProbeHR-MSP system (700-1100nm wavelength range) was used to measure a touch panel sample.
HIOKI 3169 ENG 95%
HIOKI 3169 ENG CLAMP ON POWER HiTESTER 3169-20, 3169-21 Power Measuring Instruments ■ Measure up to two 3-phase, 3-wire systems (displays voltage and current for three lines) Measure up to four single-phase, 2-wire systems ■ 0.5 A to 5000 A range ■ Compact and light weight ■ PC card data storage ■ Power recording for individual waveforms ■ Simultaneous recording of demand values and harmonics ■ POWER MEASUREMENT SUPPORT SOFTWARE 9625 The photo shows the 3169- 21 combined with CLAMP ON SENSORS 9661 and 9669 (optional) for measuring two systems.
Model Behavior 95%
Model Behavior Knowing your measurements is the key to becoming a model, but there are other good reasons to know how to measure your bust, hips and waist.
HIOKI RM3543 ENG 95%
HIOKI RM3543 ENG RESISTANCE HiTESTER RM3543, RM3543-01 Component measuring instruments Resistance Meter for Ultra-low and Low Shunt Resistance Measuring 0.1 mΩ with a High Accuracy of ±0.16% and High Resolution of 0.01 μΩ* The RM3543 and RM3543- 01 Resistance HiTESTERs can measure DC resistance such as a low shunt resistance with high speed and high accuracy using the DC four-terminal method.
HIOKI PW3336 ENG 95%
HIOKI PW3336 ENG PW3336/PW3337 POWER METER Power Measuring Instruments High-precision, 3-channel power meter with built-in harmonic measurement Accurately measure devices up to 1000 V/65 A AC/DC with direct input The PW3336 (2-channel) and PW3337 (3-channel) can measure DC and a variety of power connections ranging from single-phase 2-wire to 3-phase 4-wire*.