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HIOKI IR4053 ENG 98%

Accurate and safe measurement without creating shorts Normally, to accurately measure the insulation resistance of a generating PV, one needs to short the measured circuit.

https://www.pdf-archive.com/2015/12/25/hioki-ir4053-eng/

25/12/2015 www.pdf-archive.com

HIOKI BT4560 ENG 98%

2 Incomparable Speed Exceptional Accuracy Unsurpassed Stability Fast Low-frequency AC-IR measurement enables faster measurement No need to charge/discharge Traditionally, the internal resistance of battery cells is measured by pre-charging the battery, then passing large currents and measuring the voltage drop (DC-IR measurement).

https://www.pdf-archive.com/2015/12/24/hioki-bt4560-eng/

24/12/2015 www.pdf-archive.com

HIOKI DSM-8104 ENG 97%

HIOKI DSM 8104 ENG DIGITAL SUPER MEGOHMMETER DSM-8104, DSM-8542 Super Megohm Testers DSM-8104 (Single-Channel) DSM-8542 (Four-Channel) Options Supporting Measurements such as Surface and Volume Resistivity Power Supply Unit PSU-8541 Fast, Highly Accurate Measurement 3 × 10 16 Ω and 0.1 fA Current Resolution 2 A High Insulator with the Capacitance (the Ingredient of a Condenser) can also be Measured.

https://www.pdf-archive.com/2015/12/24/hioki-dsm-8104-eng/

24/12/2015 www.pdf-archive.com

HIOKI TM6101 ENG 97%

Additionally, updated software functionality provides the ability to generate PASS/FAIL judgments and rank measured values, making the TM6101 ideal for embedding on lines used to test LED lighting.

https://www.pdf-archive.com/2015/12/25/hioki-tm6101-eng/

25/12/2015 www.pdf-archive.com

HIOKI FT3424 ENG 96%

HIOKI FT3424 ENG LUX METER FT3424 Environmental measuring instruments Broad coverage from low to high illuminance Measure at 0.01 lx resolution to a maximum of 200,000 lx Compatible with LED lighting • Complies with DIN Class B and JIS Class AA • Save up to 99 measured values in the instrument’s internal memory and transfer them to a computer later for improved work efficiency • Timer hold function lets you make measurements in remote locations while avoiding the effects of shadows and reflections 2 Support for measurement of 1 lx makes the FT3424 ideal for low-illuminance measurement 20 lx range measurement resolution 0.01 lx 1.

https://www.pdf-archive.com/2015/12/25/hioki-ft3424-eng/

25/12/2015 www.pdf-archive.com

Alumina measurement 96%

Both thickness and optical constants of the alumina can be measured accurately using MProbe system.

https://www.pdf-archive.com/2016/05/26/alumina-measurement/

26/05/2016 www.pdf-archive.com

DeepWellsMEMSMeasurement 96%

Measurement of the thin films on the bottom of a deep well i.e. the well with  high aspect ratio, presents a challenge. Small spot measurement requires high‐NA  objective. However, high‐NA objective also limits the depth of the well that can be  measured.     In this example, our MProbe ™ Vis MSP* system was used to measure oxide  (SiO2) layer on the bottom of the round wells. The wells diameters were   80µm,  40µm, 20µm and 10µm ‐ all  100µm deep. The top surface of the sample (Si) had  photoresist layer left after lithography.   Round wells geometry were selected  because it is most difficult to measure as compared to square wells or vias of the  same geometry. 20x APO objectives with long working distance (35mm) was use for  this measurement.  The measurement spot size was ~ 20um. The reason for using  this objective was because it has the lowest NA (0.29), which is critical for  measurement in the deep wells.  Measurements in 80μm and 40μm wells gave a clean signal and were easy to align  and focus. In measurements of 20μm and 10μm wells, a part of the light beam was  reflected from the top PR, so both oxide thickness and PR thickness signal were  present in the measurement, as expected. However, it was still easy to distinguish  and determine oxide thickness because of the significantly the thicknesses of oxide  and PR were significantly different. The thickness of oxide was ~ 1.6 µm, the  thickness of PR ~ 3 µm      * MProbe is a registered  trademark of Semiconsoft,Inc, Inc.  MProbe™ Vis MSP  brochure can be found at:  http://www.semiconsoft.com/html/download/brochure/MProbeMicro_brochure2012.pdf  83 Pine Hill Rd.

https://www.pdf-archive.com/2017/02/23/deepwellsmemsmeasurement/

23/02/2017 www.pdf-archive.com

Thin Film Thickness 18-Feb 95%

The thickness of the emulsion needs to be measured for quality control, before the silver paste printing step.

https://www.pdf-archive.com/2017/02/18/thin-film-thickness-18-feb/

18/02/2017 www.pdf-archive.com

HIOKI RM3543 ENG 95%

Shunt resistance of 0.1 mΩ can be measured with an accuracy of ±1%.

https://www.pdf-archive.com/2015/12/25/hioki-rm3543-eng/

25/12/2015 www.pdf-archive.com