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HIOKI IM3570 ENG 100%
2 LCR measurement, DCR measurement, and Sweep measurement Continuous Measurement and High-speed Testing Achieved with One Instrument IMPEDANCE ANALYZER IM3570 Measurements recommended with IMPEDANCE ANALYZER IM3570 1.
HIOKI IR4053 ENG 98%
HIOKI IR4053 ENG For Photovoltaic Generation Systems INSULATION TESTER IR4053 Field Measuring Instruments Perform PV insulation resistance measurements Safely, Accurately, Quickly Safely and accurately measure PV insulation resistance even during the daytime Built-in PV dedicated function, displays measurements in 4 seconds Five ranges (50/125/250/500/1000V) built in for normal insulation resistance measurement Built-in 1000 VDC voltage measurement for open voltage tests of PV systems that support 1000 V 2 Use the PV dedicated function for accurate, safe measurements in 4 seconds Measurement not affected by generating PV The IR4053, which was designed for PV, can accurately measure insulation resistance without being affected by the generating PV.
2. Use your pet's measurements to select your crate using the chart .. (next slide) • Measuring a pet can be difficult with a tape measure. We suggest that you use a piece of string, then measure the string after taking the measurement.
HIOKI DSM 8104 ENG DIGITAL SUPER MEGOHMMETER DSM-8104, DSM-8542 Super Megohm Testers DSM-8104 (Single-Channel) DSM-8542 (Four-Channel) Options Supporting Measurements such as Surface and Volume Resistivity Power Supply Unit PSU-8541 Fast, Highly Accurate Measurement 3 × 10 16 Ω and 0.1 fA Current Resolution 2 A High Insulator with the Capacitance (the Ingredient of a Condenser) can also be Measured.
HIOKI 3511 50 ENG LCR HiTESTER 3511-50 Components measuring instruments Minimum measurement time of 5 ms, built-in comparator and ±0.08% measurement accuracy Improved for even faster and more efficient measurements !
HIOKI FT3424 ENG 96%
HIOKI FT3424 ENG LUX METER FT3424 Environmental measuring instruments Broad coverage from low to high illuminance Measure at 0.01 lx resolution to a maximum of 200,000 lx Compatible with LED lighting • Complies with DIN Class B and JIS Class AA • Save up to 99 measured values in the instrument’s internal memory and transfer them to a computer later for improved work efficiency • Timer hold function lets you make measurements in remote locations while avoiding the effects of shadows and reflections 2 Support for measurement of 1 lx makes the FT3424 ideal for low-illuminance measurement 20 lx range measurement resolution 0.01 lx 1.
Measurement of the thin films on the bottom of a deep well i.e. the well with high aspect ratio, presents a challenge. Small spot measurement requires high‐NA objective. However, high‐NA objective also limits the depth of the well that can be measured. In this example, our MProbe ™ Vis MSP* system was used to measure oxide (SiO2) layer on the bottom of the round wells. The wells diameters were 80µm, 40µm, 20µm and 10µm ‐ all 100µm deep. The top surface of the sample (Si) had photoresist layer left after lithography. Round wells geometry were selected because it is most difficult to measure as compared to square wells or vias of the same geometry. 20x APO objectives with long working distance (35mm) was use for this measurement. The measurement spot size was ~ 20um. The reason for using this objective was because it has the lowest NA (0.29), which is critical for measurement in the deep wells. Measurements in 80μm and 40μm wells gave a clean signal and were easy to align and focus. In measurements of 20μm and 10μm wells, a part of the light beam was reflected from the top PR, so both oxide thickness and PR thickness signal were present in the measurement, as expected. However, it was still easy to distinguish and determine oxide thickness because of the significantly the thicknesses of oxide and PR were significantly different. The thickness of oxide was ~ 1.6 µm, the thickness of PR ~ 3 µm * MProbe is a registered trademark of Semiconsoft,Inc, Inc. MProbe™ Vis MSP brochure can be found at: http://www.semiconsoft.com/html/download/brochure/MProbeMicro_brochure2012.pdf 83 Pine Hill Rd.
HIOKI 3561 ENG 96%
• Measure high-voltage battery packs up to 300V (with the BT3563) • Ideal for high-precision cell voltage measurements (accurate to 0.01% of reading) • Measurement circuitry employs enhanced current regulation • Fast 10 ms response and 8 ms sampling time for high-speed measurements (with the BT3563 and BT3562) • Ranges from 3 mΩ to 3000 Ω (with the BT3563 and BT3562) support coin-size to large-cell batteries 2 Resistance and voltage measurements BATTERY HiTESTER BT3563 BT3562 3561 Measurement Parameters and Applications l High-voltage battery pack testing l Battery module testing l Large (low-resistance) cell testing l High-speed mass production testing of coin batteries l Fuel cell stack measurements l Battery research and development measurement applications Lithium-Ion and Secondary Batteries Cell phones E-books BATTERY HiTESTER BT3563 BATTERY HiTESTER BT3562 BT3563
HIOKI 3157 ENG 96%
The 3157-01 can carry out measurements in accordance with the stipulations of multiple standards.
Model Behavior 95%
Model Behavior Knowing your measurements is the key to becoming a model, but there are other good reasons to know how to measure your bust, hips and waist.
הסבר מדידות מעודכן How to take proper body measurements Please follow these rules to get the error-free body measurements.