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HIOKI FA1116 ENG 100%

FLYING PROBE TESTER FA1116-03 Automatic Testing Equipment High-speed testing at up to 100 points/sec.

https://www.pdf-archive.com/2015/12/24/hioki-fa1116-eng/

24/12/2015 www.pdf-archive.com

Cygnus Dive Mk2 96%

Cygnus Dive Mk2 - CYG-001-7210 Wrist-Mountable Underwater Thickness Gauge w/ Remote Probe                 o o o  o o                    Features:

https://www.pdf-archive.com/2016/12/01/cygnus-dive-mk2/

01/12/2016 www.pdf-archive.com

HIOKI 1231 ENG 96%

■Four-terminal probe method Four-terminal probes are used for all points (2 probes per point).

https://www.pdf-archive.com/2015/12/24/hioki-1231-eng/

24/12/2015 www.pdf-archive.com

HIOKI FA1282 ENG 95%

FLYING PROBE TESTER FA1282 Automatic Testing Equipment Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom High-precision probing Ideal for use with thin boards and device embedded substrates 2 Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom Point 1 High-precision probing Point 2 Max.100 steps/s ultra-highspeed inspection Industry-leading precision (See benchmarks to experience it for yourself!) Industry-leading speed 1.

https://www.pdf-archive.com/2015/12/24/hioki-fa1282-eng/

24/12/2015 www.pdf-archive.com

Tools in Space 94%

Infrared telescopes can Gind young stars that are hidden behind clouds of dust and gas, as well as very old and distant stars.” (Page 13) Integral Gamma-Ray Observatory Chandra X-Ray Observatory Exploding Star in Gamma Rays Wind and Reflection Sun in Ultraviolet From a Black Hole in X Ray Soho Observatory Spitzer Space Telescope Steller Nursery In Infrared Space Probes A space probe is an unpiloted spacecraft that leaves Earth’s orbit to explore the Moon, planets, asteroids, comets, or other objects in outer space as directed by on board computers and/or instructions sent from Earth.

https://www.pdf-archive.com/2018/03/16/tools-in-space/

16/03/2018 www.pdf-archive.com

HIOKI RM3542 ENG 94%

Contact Check While Measuring • Detects probe bounce Contact a n d c o n t a c t re s i s - Condition tance fluctuations while measuring • Minimizes contact time Contact Checking Before and After Measuring • Contact condition during Contact measurement is probe- Condition dependent.

https://www.pdf-archive.com/2015/12/25/hioki-rm3542-eng/

25/12/2015 www.pdf-archive.com

2014 06 PR Wireless probes EN 93%

Freedom and mobility Freedom of movement is an unquestionable asset during measurements taken with the help of a manual instrument, and enables moving or rotating the probe around the component to measure.

https://www.pdf-archive.com/2014/07/01/2014-06-pr-wireless-probes-en/

01/07/2014 www.pdf-archive.com

HIOKI DT4200 ENG 93%

Extensive selection of probe tips that you can choose based on the measurement location, improving ease of measurement With the DT4200, you can choose the probe type that best suits your measurement location, making it possible to measure in areas that can’t be reached with conventional probes and busbars that you wish to clamp between probes.

https://www.pdf-archive.com/2015/12/24/hioki-dt4200-eng/

24/12/2015 www.pdf-archive.com

an47fa 92%

AN47-8 Poor Probe Grounding ................................................................................................................................. AN47-8 Undercompensated Probe ............................................................................................................................

https://www.pdf-archive.com/2017/04/02/an47fa/

02/04/2017 www.pdf-archive.com

HIOKI RM3543 ENG 90%

The intensity of the Contact Improver function can be adjusted to suit the probe type.

https://www.pdf-archive.com/2015/12/25/hioki-rm3543-eng/

25/12/2015 www.pdf-archive.com

HIOKI RM3544 ENG 90%

300mA Measure from 0.000 mΩ (@ 300 mA) to 3.5 MΩ Probe for guard jack use and increased measurement current yield an instrument that’s more resistant to noise.

https://www.pdf-archive.com/2015/12/25/hioki-rm3544-eng/

25/12/2015 www.pdf-archive.com

Info YVB Probe ChinaTour 89%

INFORMATION Probe/ Vorbereitung China-Tournee Wann/Wo:

https://www.pdf-archive.com/2015/02/03/info-yvb-probe-chinatour/

03/02/2015 www.pdf-archive.com

Transcranial Doppler Systems 89%

Offers an optional imaging probe for complete and accurate color-coded ultrasound scanning of the Carotid system.

https://www.pdf-archive.com/2015/11/24/transcranial-doppler-systems/

24/11/2015 www.pdf-archive.com

HIOKI LR8400-92 ENG 88%

System components PV Power Verifier LR8400-92 (200A AC/DC Sensor and other bundled accessories) Option Parts Set (Bundled) Differential Probe 9322 Memory HiLogger LR8400-23 (PV Edition) Clamp On AC/DC Sensor CT9692-90 Magnetic Adapter 9804-01 (Red) 9804-02 (Black) Pyranometer (Manufactured by EKO INSTRUMENTS for LR8400-92/ -93) Thermocouple (20m) Power Cord (for Differential Probes) BNC Conversion Cable x 2 (for Clamp Sensors and Differential Probes) Magnetic Sheet PV Power Verifier LR8400-93 (2000A AC/DC Sensor and other bundled accessories) Option Parts Set (Bundled) Differential Probe 9322 Memory HiLogger LR8400-23 (PV Edition) Clamp On AC/DC Sensor CT9693-90 Magnetic Adapter 9804-01 (Red) 9804-02 (Black) Pyranometer (Manufactured by EKO INSTRUMENTS for LR8400-92/ -93) Thermocouple (20m) Power Cord (for Differential Probes) BNC Conversion Cable x 2 (for Clamp Sensors and Differential Probes) Magnetic Sheet Options Clamp On AC/DC Sensor CT9691-90 (AC/DC 100A) Clamp On AC/DC Sensor CT9692-90 (AC/DC 200A) Clamp On AC/DC Sensor CT9693-90 (AC/DC 2000A) Battery Pack Z1000 Carrying Case PC Card 2G 9830 PC Card 1G 9729 PC Card 512M 9728 PC Card Precaution Use only PC Cards sold by Hioki.

https://www.pdf-archive.com/2015/12/25/hioki-lr8400-92-eng/

25/12/2015 www.pdf-archive.com

HIOKI UA1782 ENG 88%

Dedicated visualization software for Hioki electrical testing equipment and data creation systems • Visualize test results from flying-probe testers • Pinpoint components and patterns from test result files • Display the probing positions of test fixtures or test heads for both ICT and bare board testers • Search for components and nets on device embedded substrates 2 Quickly find the locations of failed components Get started quickly with real-time file loading Flying probe tester FAIL Files displayed along with a FAIL-MAP you can...

https://www.pdf-archive.com/2015/12/25/hioki-ua1782-eng/

25/12/2015 www.pdf-archive.com

HIOKI MR8875 ENG 88%

Motor current Example of module combinations Control signal (logic probe) Analog Unit MR8901 Voltage/Temp Unit MR8902 Strain Unit MR8903 R&D or Science Experiments Voltage Temperature ×2 ×1 ×1 With its multichannel, long-term recording capabilities, the MR8875 is ideally suited for use in development applications such as performance and durability testing.

https://www.pdf-archive.com/2015/12/25/hioki-mr8875-eng/

25/12/2015 www.pdf-archive.com

HIOKI BT4560 ENG 88%

Probe cables of up to 4 m are supported, improving the flexibility of cabling in production lines.

https://www.pdf-archive.com/2015/12/24/hioki-bt4560-eng/

24/12/2015 www.pdf-archive.com

Lecroy WaveRunner 62Xi.PDF 88%

with complete tip and ground accessories make it easy to probe your signals.

https://www.pdf-archive.com/2016/02/15/lecroy-waverunner-62xi/

15/02/2016 www.pdf-archive.com

3032.0000 88%

Both sensors are located at the tip of a probe and protected by a membrane filter.

https://www.pdf-archive.com/2017/08/21/3032-0000/

21/08/2017 www.pdf-archive.com

TESA Training Catalogue 88%

Purpose P16-1407 - Inductive Probes English For Description Purpose Session 1 Session 2 Prerequisites  - None 1 day Sellers and Technical Sellers Inductive probe measuring system, components, key points, mutligauging solution.

https://www.pdf-archive.com/2014/02/17/tesa-training-catalogue/

17/02/2014 www.pdf-archive.com

Tastkopf Multi Contact (MC) Isoprobe-II 88%

Safety high-frequency 10:1 test probe highly flexible PVC-insulated coaxial connecting lead with BNC plug.

https://www.pdf-archive.com/2017/04/02/tastkopf-multi-contact-mc-isoprobe-ii/

02/04/2017 www.pdf-archive.com

TESA Training Catalogue descriptive 2015 88%

P16-1507 - Inductive Probes Session 1 English For Description Purpose 1 day Session 2 Session 3  Prerequisites None Sellers and Technical Sellers Inductive probe measuring system, components, key points, mutligauging solution.

https://www.pdf-archive.com/2015/02/05/tesa-training-catalogue-descriptive-2015/

05/02/2015 www.pdf-archive.com

InstekGOS 635G 622G 620.specsheet 87%

User manual x 1, Power Cord x 1 Probe-GTP-060A-4 :

https://www.pdf-archive.com/2015/04/01/instekgos-635g-622g-620-specsheet/

31/03/2015 www.pdf-archive.com