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HIOKI FA1116 ENG 100%

of test steps Test  ranges Measurement signal Measurement ranges Decision range setting Measurement time Minimum pad diameter Minimum movement step Minimum Probing  pitch Probe work area 2 2 Max.


HIOKI 1231 ENG 96%

(2) (1) Supply Probing precision of 10 μm Support for fine pattern probing Untested work LEAK OPEN PASS ■High-precision probing Thanks to a high mechanical repeatability of within 10 μm, the 1231 is capable of probing boards with increasingly fine patterns.


Application Case Multi-cotes EN 10.06.14 95%

Custom Solutions PMI Gauging Systems Overview probing system Application view Diagram of measurement plan Application Input shaft The two identical fixtures are integrated in a manufacturing line, each one supporting one soft turning machine.


HIOKI FA1282 ENG 95%

FLYING PROBE TESTER FA1282 Automatic Testing Equipment Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom High-precision probing Ideal for use with thin boards and device embedded substrates 2 Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom Point 1 High-precision probing Point 2 Max.100 steps/s ultra-highspeed inspection Industry-leading precision (See benchmarks to experience it for yourself!) Industry-leading speed 1.


Tools in Space 94%

Read the following passages.


an47fa 92%

AN47-15 About Probes and Probing Techniques ......................................................................................................


HIOKI RM3543 ENG 90%

One PLC = one power line cycle (mains waveform period) DELAY1 = Set to allow for mechanical delay of trigger input and probing (affects all ranges), from 0.0 to 100.0 ms DELAY2 *1 = Set to allow for measurement object response (each range independently), from 0.0 to 100.0 ms Self-calibration, probe short-circuit detection, Contact Improver, current mode setting, OVC (offset voltage compensation), settings monitor, retry, average (OFF, 2 to 32 times), scaling, statistical calculations, key-lock, comparator (relative tolerance or absolute range modes), EOM pulse width setting, data export, binary data output, auto-memory *1.


Info YVB Probe ChinaTour 89%

INFORMATION Probe/ Vorbereitung China-Tournee Wann/Wo:


HIOKI UA1782 ENG 88%

Dedicated visualization software for Hioki electrical testing equipment and data creation systems • Visualize test results from flying-probe testers • Pinpoint components and patterns from test result files • Display the probing positions of test fixtures or test heads for both ICT and bare board testers • Search for components and nets on device embedded substrates 2 Quickly find the locations of failed components Get started quickly with real-time file loading Flying probe tester FAIL Files displayed along with a FAIL-MAP you can...


Lecroy WaveRunner 62Xi.PDF 88%

3 Fast Long Memory with Front Panel Zoom Controls Complete Probing Solutions WaveRunner Xi's long memory is optimized for calculation of more information 10-100x faster than other oscilloscopes, while enabling easy access to simple zooming and positioning from the front panel.


3032.0000 88%

3032.0000 BG Date: 23rd April 2014 Signature: