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of test steps Test ranges Measurement signal Measurement ranges Decision range setting Measurement time Minimum pad diameter Minimum movement step Minimum Probing pitch Probe work area 2 2 Max.
(2) (1) Supply Probing precision of 10 μm Support for fine pattern probing Untested work LEAK OPEN PASS ■High-precision probing Thanks to a high mechanical repeatability of within 10 μm, the 1231 is capable of probing boards with increasingly fine patterns.
Custom Solutions PMI Gauging Systems Overview probing system Application view Diagram of measurement plan Application Input shaft The two identical fixtures are integrated in a manufacturing line, each one supporting one soft turning machine.
FLYING PROBE TESTER FA1282 Automatic Testing Equipment Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom High-precision probing Ideal for use with thin boards and device embedded substrates 2 Horizontal Double-sided Tester 2 probes on the top + 2 probes on the bottom Point 1 High-precision probing Point 2 Max.100 steps/s ultra-highspeed inspection Industry-leading precision (See benchmarks to experience it for yourself!) Industry-leading speed 1.
One PLC = one power line cycle (mains waveform period) DELAY1 = Set to allow for mechanical delay of trigger input and probing (affects all ranges), from 0.0 to 100.0 ms DELAY2 *1 = Set to allow for measurement object response (each range independently), from 0.0 to 100.0 ms Self-calibration, probe short-circuit detection, Contact Improver, current mode setting, OVC (offset voltage compensation), settings monitor, retry, average (OFF, 2 to 32 times), scaling, statistical calculations, key-lock, comparator (relative tolerance or absolute range modes), EOM pulse width setting, data export, binary data output, auto-memory *1.
Dedicated visualization software for Hioki electrical testing equipment and data creation systems • Visualize test results from flying-probe testers • Pinpoint components and patterns from test result files • Display the probing positions of test fixtures or test heads for both ICT and bare board testers • Search for components and nets on device embedded substrates 2 Quickly find the locations of failed components Get started quickly with real-time file loading Flying probe tester FAIL Files displayed along with a FAIL-MAP you can...
3 Fast Long Memory with Front Panel Zoom Controls Complete Probing Solutions WaveRunner Xi's long memory is optimized for calculation of more information 10-100x faster than other oscilloscopes, while enabling easy access to simple zooming and positioning from the front panel.